ENC TECHNOLOGY

OLEDoS/LEDoS

  • Exterior Vision Inspection
  • Optical Compensation Inspection
  • Automation
  • Reliability Chamber
  • Quality Evaluation

Exterior Vision Inspection

Equipment that automatically inspects the external defects of Micro Display based on Vision/Algorithm technology

It can improve the yield rate/quality and the management of defective data when compared to the inspection by human eyes, minimizing the inspection manpower

Feature

  • It can make Micro Display inspection and re-examination by applying various optical systems
  • It can perform automatic inspection by linking inspection program/algorithm and control
  • We responded to rigid Micro Display inspection by developing various inspection stages
  • We optimized the inline production by applying CIM Program
  • We provide vibration reduction solution
  Mobile XR(VR/AR/MR)
Module Module
Rigid

Optical
Compensation
Inspection

A. Gamma Compensation

Process for optimal quality improvement by adjusting the nonlinear relationship between the input signal and the output image using a signal generator and a chromaticity meter to adjust the brightness and color of the screen in the display device

Feature

  • Adjusting the nonlinearity of brightness compared to the display output
  • Setting the target value (L, x, y) according to the determined Gamma value
  • Compensating for brightness and color distortion through accurate calibration
  • Fast and accurate compensation through an optimized algorithm

B. Mura Compensation

Process for optimal quality improvement by compensating for uneven screen brightness where a specific area of the screen appears brighter or darker than other areas in the display device

Feature

  • Defect analysis through precise Mura phenomenon measurement for each pattern
  • Calculation of brightness compensation data for each pixel through an algorithm
  • Fast and accurate compensation through circuit compensation and re-verification procedure

C. Optical Inspection

Act to enhance the reliability and efficiency of the process through optical quality evaluation of the display device after calibration for each process

Feature

  • Checkup of the quality by measuring the color, brightness, contrast ratio, etc. of the display
  • Early detection of problems such as defects and uniformity issues
  • Continuous quality improvement by reflecting evaluation results in the production process

D. Wafer EL Inspection

The electrical/optical characteristics of the chip are measured through total inspection of the micro LED chip in the wafer state, and classified by rank

We improve the yield rate and reliability of Micro LED Display by inspecting the EL characteristics of the chip at a high speed

Feature

  • The current and voltage is inspected at a high speed through the multi-contact of precision probe units
  • EL optical inspection and judgment are made at a high speed with optimal detector
  • We measure it by applying self-developed precision Multi Power Source
  • We conduct the automatic precision control through Auto Focus and Alignment
  • EL(Electro Luminescence): Light emission through electric energy

Automation

Automation system is based on its high reliability and the facilities before and after inspection

A. Loader/Unloader

  • It is installed before and after the inspection facility for input/discharge/transfer
  • It connects the logistics of front facility and inputs the pallets at the same time
  • It checks the presence and loading status of cells on the tray using the vision
  • It has the cleaning option at the input end
  • It is controlled by PC/PLC

B. Stacker

  • Equipment that separates good(OK) and defective(NG) products after inspection and loads them separately in trays or cassettes
  • It separately stacks the OK and NG trays
  • It checks the presence and loading status of cells on the tray using the vision
  • It is controlled by PC/PLC

C. Buffer facility

  • Equipment that plays the role of buffer or re-input required for logistics operation
  • It checks the presence and loading status of cells on the tray using the vision
  • It is controlled by PC/PLC

Reliability Chamber

Equipment to test the reliability of the product whether it can perform its function without problems under given conditions by uniformly controlling various environmental stress factors

Feature

  • Temperature rise/fall speed 1℃/min
  • Option to choose water-cooling/air-cooling type
  • Option for customer to adjust to Internal size and appearance/No. of channels
  • Options for various measurement environments
  • Constant temperature/humidity type : Temperature-40℃~100 ℃(±1.5 ℃), Humidity 30~95% (±3%)
  • Low/high temperature type : -40℃~100 ℃(±1.5 ℃)
  • LTS
  • IVL
  • Aging
  • FPMS
  • Impedance Measurement

LTS

LTS ( Life Time measurement System )

Equipment that evaluates the life characteristics by applying electrical/temperature characteristics
to Micro Display TEG cells

It has options(Peltier/Chamber, etc.) according to the measurement temperature environment

Feature

  • The electrical characteristics of the Micro Display TEG cell can be precisely analyzed by measuring the voltage/current applied to the cell
  • We have the consistency data and evaluation S/W so as to evaluate the life characteristics of the cell
  • It can respond to various samples
  • We perform optical measurement using Photo Diode/
    Spectroradiometer, and utilize the optimal evaluation
    program.
    (Light intensity, luminance, spectrum measurement)
  • Using the self-developed precision power module, we secure the consistency of evaluation data with minimal noise
  • We can make the independent conditional test for each channel
  • There are various measurement environment options
  • Photo Diode type (Chamber)
    : Room temperature, high temperature(25°C~120°C),
    high/low temperature(-40°C~120°C)
  • Spectroradiometer type (Peltier) : Room temperature, high temperature(25°C~100°C)

IVL
(Microscope EL)

IVL ( Intensity of electron flow Voltage Luminance )

Equipment that analyzes the Electro Luminescence characteristics of Micro Display from several to tens of ㎛ in size through the microscopic measurement

Feature

  • The optical characteristics of Micro Display are analyzed as an image with an optimal detector
  • It performs precise measurement through vibration prevention, noise separation, Auto Alignment,
    and Auto Focus functions
  • It applies the calibration by magnification for micro optical measurement
  • It holds the S/W for measuring and evaluating various EL characteristics
  • EL(Electro Luminescence): Light emission through electric energy

Aging

Aging

Equipment that, after applying electrical/temperature characteristics to Micro Display TEG Cell(Aging),
evaluates the reliability of samples by aging time using an optical sensor

Feature

  • The characteristics of Micro Display TEG Cell can be precisely evaluated by analyzing the light intensity according to
    the aging time of cell.
  • It provides various measurement environment options and recipe programs according to inputting conditions for
    each time period
  • It is equipped with precise multi-channel control power module developed by us as well as noise minimizing function

FPMS

FPMS ( FPD Performance Measurement System )

Equipment that measures and evaluates the electrical and optical characteristics of the Micro Display

It evaluates the display characteristics based on various evaluation standards

Feature

  • It can respond to various detectors(Spectroradiometer, Photometer, etc.) for each measurement item
  • It can operate in automatic/manual modes by evaluation standard(VESA, TCO, ISO-13406, etc.)
  • It can respond to various panels from mobile use ones to ultra-large ones over 100" as well as customer options

(Option for Full Auto)

  • The samples are automatically input, aged, measured, and discharged
  • Simultaneously with the measurement, aging work is executed on the sample to be measured.
  • Aging Zone and Measurement Zone are divided and controlled separately(PC/PLC)
  Mobile Tablet Notebook Monitor TV DID
Normal
Full Auto
  • Mobile : Including Watch
  • DID(Digital Information Display)

Impedance
Measurement

Impedance Measurement

Equipment that measures the changed impedance characteristics by applying the changed frequency
to the Micro Display according to the variable voltage

Feature

  • It can acquire the data fast
  • It makes precision measurement with high accuracy and repeatability
  • It performs a various analysis through application of different frequencies
  • It has the control program optimized for evaluation